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ABTS-Li Advanced Burn-In & Test System

AEHR - ABTS-Li

System Benefits:
• Addresses High Power Burn-In
¨ Burn-in and test of high-power
logic up to 100W
¨ Fully integrated individual
device temperature sensing,
control, and reporting
¨ Individual power supplies /DUT
prevents burned sockets & BIB
caused by shorted devices
• High Reliability and Uptime
¨ Redundant architecture
¨ Hot-swap electronics and
power supplies
• Low Cost of Ownership
¨ Up to 72 burn-in board slots
¨ Small footprint
¨ No side access required
¨ Highly efficient power delivery
¨ Low-power standby mode
• Highly Configurable for Production

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