Engineering Data Analysis - Analysis-Ready Database

PDF Solutions - Analysis-Ready DB

 

• The database brings all your data, together in one place
• Fab data types: FDC, metrology, equipment, defect, environmental, events, and others
• Test data types: E-test / PCM, sort, final test, bitmap, and others
• Robust retrieval GUIs and APIs are available
• Data sources are fully-aligned at load time to make it easy to quickly merge, overlay and drill down to data from different sources
• Stored meta-data hierarchy (technology, process, product, date, lot, equipment, and others) makes it easy to quickly find exactly the data needed
• Multiple sets of limits, with versioning, are stored for metrology and test data
• Lot and wafer level summary statistics are pre-calculated at load time for best retrieval performance
• Database schema and retrievals are optimized for loading and retrieval performance across all data types
• Dynamic database automatically accommodates new products, programs, parameters, etc.
• Incoming data can be augmented with missing material descriptions, meta-data, process splits, wafer map configurations, tags, lot genealogy, etc.
• Data loaders provided by PDF are available for all semiconductor data sources
• Oracle and Informix databases are supported on UNIX and LINUX servers
• Databases can grow as large as needed - up to many Terabytes in size