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• Flexible Solution for High Throughput Test Floor
¨ Same system tests memory or logic
¨ Reduces floor space requirements
• Cost-effective Solution for Single Touchdown Full Wafer Test
¨ Dramatically reduces test time
¨ Up to 12,000 power channels
¨ Up to 3500 I/O channels ( nearly 200,000 device I/O lines
using parallel test technology )
¨ Electronics optimized for BIST/DFT testing
• Production Proven Full-Wafer Tester Solution
¨ Dozens of systems in production
¨ Protects wafers and probe cards with individual power
channel over-current protection
¨ Standard cassette/FOUP automation
